论文标题
使用两光子微波光谱法测量Rb G系列量子缺陷
Measurement of Rb g-series quantum defect using two-photon microwave spectroscopy
论文作者
论文摘要
我们利用$ ng \ rightarrow（n+2）g $ transitions的两光量高精度微观光谱光谱，以精确衡量$^{85} $ rb的高角度 - 摩托米$ g $ series量子缺陷。 $ ng $状态中冷rydberg原子的样品是通过三光子光激发与受控电场混合结合在一起制备的，并用40- $ $ $ $ $ S的微波相互作用脉冲进行了探测。领先的系统不确定性是由直流恒星移动引起的，这是通过在所有三个维度中取消背景电场来解决的。根据我们的测量以及对直流和交流型偏移，范德华相互作用以及微波频率校准的系统不确定性的分析，我们获得$Δ_0= 0.0039990（21）$和$Δ_2= -0.0202（21）$。我们在其他地方的最新工作以及针对精确度量的应用中讨论了我们的结果。
We utilize two-photon high-precision microwave spectroscopy of $ng\rightarrow(n+2)g$ transitions to precisely measure the high-angular-momentum $g$-series quantum defect of $^{85}$Rb. Samples of cold Rydberg atoms in the $ng$ state are prepared via a three-photon optical excitation combined with controlled electric-field mixing and probed with 40-$μ$s-long microwave interaction pulses. The leading systematic uncertainty arises from DC Stark shifts, which is addressed by a cancellation of background electric fields in all three dimensions. From our measurements and an analysis of systematic uncertainties from DC and AC Stark shifts, van der Waals interactions, and microwave frequency calibration, we obtain $δ_0=0.0039990(21)$ and $δ_2=-0.0202(21)$. We discuss our results in context with recent work elsewhere, as well as applications towards precision measurement.
