论文标题
高-TC铜酸盐的电阻率
The Resistivity of High-Tc Cuprates
论文作者
论文摘要
我们表明，高-TC蛋白酶的每个阶段的电阻率是源自Kubo公式的一般表达的特殊情况。我们尤其获得了奇怪的金属（SM）和上pseudogap（PG）阶段中的T线性行为，即在强大的额定状态以及$ t^{1+δ} $行为中观察到的纯$ t^2 $，费米液体（FL）行为，这些行为均在交叉侧面插入。我们计算了线性制度中$ t $的系数：a）$ t $，并表明它与pg温度$ t^*（x）$成比例; b）FL制度中$ t^2 $ - 期的b），而无需调整任何参数；和c）在交叉策略中的$ t^{1.6} $项，都与实验数据非常吻合。从我们的模型中，我们能够推断出铜岩中的电阻率是由激子散射孔引起的，激子自然形成，因为孔被掺入电子背景中。
We show that the resistivity in each phase of the High-Tc cuprates is a special case of a general expression derived from the Kubo formula. We obtain, in particular, the T-linear behavior in the strange metal (SM) and upper pseudogap (PG) phases, the pure $T^2$, Fermi liquid (FL) behavior observed in the strongly overdoped regime as well as the $T^{1+δ}$ behavior that interpolates both in the crossover. We calculate the coefficients: a) of $T$ in the linear regime and show that it is proportional to the PG temperature $T^*(x)$; b) of the $T^2$-term in the FL regime, without adjusting any parameter; and c) of the $T^{1.6}$ term in the crossover regime, all in excellent agreement with the experimental data. From our model, we are able to infer that the resistivity in cuprates is caused by the scattering of holes by excitons, which naturally form as holes are doped into the electron background.
