论文标题
使用纳米缝结构检测薄层中共振频率的敏感性
Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures
论文作者
论文摘要
当使用纳米缝结构检测薄层时，我们得出共振频率的公式及其灵敏度。对于在纳米结构上沉积$ h $的薄层，我们定量显示，对于带有缝隙孔径尺寸$δ$的单个和周期性缝隙结构，共振频率的敏感性会随着$ h $的增加而降低。具体而言，如果$ h>δ$和$ o（1+ \ ln H/δ）$的订单$ O（δ/h）$的灵敏度为$ O（δ/h）$否则。 evanevencent的波模式沿着薄介电膜和上面的环境介质之间的界面存在。从数学推导中，可以观察到共振频率的灵敏度高度取决于逃生波模式对微小缝隙孔的影响。
We derive the formulas for the resonance frequencies and their sensitivity when the nano-slit structures are used in the detection of thin layers. For a thin layer with a thickness of $H$ deposited over the nanostructure, we show quantitatively that for both single and periodic slit structures with slit aperture size $δ$, the sensitivity of resonance frequency reduces as $H$ increases. Specifically, the sensitivity is of order $O(δ/H)$ if $H >δ$ and of order $O(1+\ln H/δ)$ otherwise. The evanescent wave modes are present along the interface between the thin dielectric film and ambient medium above. From the mathematical derivations, it is observed that the sensitivity of the resonance frequency highly depends on the effect of evanescent wave modes on the tiny slit apertures.
