论文标题
对老化监视和重新配置技术的调查
A Survey of Aging Monitors and Reconfiguration Techniques
论文作者
论文摘要
CMOS技术缩放使衰老效应成为集成电路的设计和制造的重要问题。衰老恶化会降低电路的使用寿命，使其更早失败。这种恶化会影响电路的所有部分，并影响其性能和可靠性。当代文献展示了使用硬件和软件监控机制和重新配置技术来监测和减轻老化的解决方案。对最先进的审查的目的是确定现有的衰老监测和重新配置解决方案。这项调查评估了衰老研究，重点是2012年至2019年，并提出了对监视器和重新配置技术的分类。结果表明，用于衰老检测的最常见的监视器类型是监视时间误差，而用于处理衰老的最常见的重新配置技术是电压缩放。此外，大多数文献贡献都在数字领域，使用硬件解决方案来监视电路中的老化。在模拟区域中，文献贡献很少，这是数字领域调查的范围。通过审查这些解决方案，该调查指出了进一步研究和开发老化监测器和重新配置技术的方向
CMOS technology scaling makes aging effects an important concern for the design and fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit, making it fail earlier. This deterioration can affect all portions of a circuit and impacts its performance and reliability. Contemporary literature shows solutions to monitor and mitigate aging using hardware and software monitoring mechanisms and reconfiguration techniques. The goal of this review of the state-of-the-art is to identify existing monitoring and reconfiguration solutions for aging. This survey evaluates the aging research, focusing the years from 2012 to 2019, and proposes a classification for monitors and reconfiguration techniques. Results show that the most common monitor type used for aging detection is to monitor timing errors, and the most common reconfiguration technique used to deal with aging is voltage scaling. Furthermore, most of the literature contributions are in the digital field, using hardware solutions for monitoring aging in circuits. There are few literature contributions in the analog area, being the scope of this survey in the digital domain. By scrutinizing these solutions, this survey points directions for further research and development of aging monitors and reconfiguration techniques
