论文标题
在基于轴上干涉仪的定量相显微镜中击败时间相灵敏度极限
Beating Temporal Phase Sensitivity Limit in Off-axis Interferometry based Quantitative Phase Microscopy
论文作者
论文摘要
相位灵敏度决定了可以从定量相显微镜（QPM）系统中从噪声底检测到的最低光路径长度（OPL）值。已知时间敏感性受到光子射击和电子设备和环境的各种噪声源的限制。为了击败时间相灵敏度极限，我们探索了使用激光刷新在基于离轴干涉量的QPM中减少不同噪声因子的不同方法。使用高电子孔容量摄像机，我们在不同的环境条件下使用了非通用路径和基于常见的干涉量学QPM系统测量了时间相灵敏度值。框架求和方法和时空滤波方法进一步用于减少噪声贡献，从而使我们能够将整个时间相位敏感性推向少于2个皮仪。
Phase sensitivity determines the lowest optical path length (OPL) value that can be detected from the noise floor in a quantitative phase microscopy (QPM) system. The temporal phase sensitivity is known to be limited by both photon shot-noise and a variety of noise sources from electronic devices and environment. To beat temporal phase sensitivity limit, we explore different ways to reduce different noise factors in off-axis interferometry-based QPM using laser-illumination. Using a high electron-well-capacity camera, we measured the temporal phase sensitivity values using non-common-path and common-path interferometry based QPM systems under different environmental conditions. A frame summing method and a spatiotemporal filtering method are further used to reduce the noise contributions, thus enabling us to push the overall temporal phase sensitivity to less than 2 picometers.
