论文标题

Atlas快速跟踪器VME板的冷却和计时测试

Cooling and Timing tests of the ATLAS Fast Tracker VME boards

论文作者

Sottocornola, S., Annovi, A., Biesuz, N. V., Brost, E., Calvetti, M., Gentsos, C., Holmes, T., Horyn, L., Iizawa, T., Lanza, A., Long, J. D., Mastrandrea, P., Maznas, I., Negri, A., Calabro, D., Piendibene, M., Roda, C., Romano, E., Seiss, T.

论文摘要

快速跟踪器(FTK)是用于完整事件,低延迟,高速跟踪的Atlas Trigger升级。由9U VME板制成的FTK核心执行最苛刻的计算任务。插入同一VME插槽的正面和后侧的关联存储板串行链接处理器(ABS)和辅助卡(AUX)构成了处理单元(PU),该单元(PU)使用内部检测器的8层命中找到轨道。 PU与第二阶段板(SSB)一起使用,该板通过在确定的轨道中添加额外的命中来找到12层轨道。在设计的配置中,在VME板条箱中安装了16个PU和4个SSB。 AMB,AUX和SSB的高功率消费(分别为250 W,70 W和160 W)需要开发自定义冷却系统。尽管与常见的VME设置相比,FTK系统的每个VME板条箱的预期功耗很高,但8 FTK核心板条箱也将使用$ \ $ \ $ 60 kW,这仅是CPU农场所需的一小部分,而CPU农场所需的空间执行了同一任务。我们报告了FTK系统内32个PU和8个SSB的集成,在运行和冷却它们所需的基础架构以及在测试中进行的基础架构,以验证安全价值以安全价值验证系统处理速率和温度稳定性。

The Fast Tracker (FTK) is an ATLAS trigger upgrade built for full event, low-latency, high-rate tracking. The FTK core, made of 9U VME boards, performs the most demanding computational task. The Associative Memory Board Serial Link Processor (AMB) and the Auxiliary card (AUX), plugged on the front and back sides of the same VME slot, constitute the Processing Unit (PU), which finds tracks using hits from 8 layers of the inner detector. The PU works in pipeline with the Second Stage Board (SSB), which finds 12-layer tracks by adding extra hits to the identified tracks. In the designed configuration, 16 PUs and 4 SSBs are installed in a VME crate. The high power-consumption of the AMB, AUX and SSB (respectively of about 250 W, 70 W and 160 W per board) required the development of a custom cooling system. Even though the expected power consumption for each VME crate of the FTK system is high compared to a common VME setup, the 8 FTK core crates will use $\approx$ 60 kW, which is just a fraction of the power and the space needed for a CPU farm performing the same task. We report on the integration of 32 PUs and 8 SSBs inside the FTK system, on the infrastructures needed to run and cool them, and on the tests performed to verify the system processing rate and the temperature stability at a safe value.

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