论文标题
测量引起的关键性时的纠缠消极情绪
Entanglement Negativity at Measurement-Induced Criticality
论文作者
论文摘要
我们提出纠缠负性,作为测量引起的临界性的细粒探针。我们激励在稳定器状态下进行这一建议,其中两个不相交的子区域比较了它们的“相互负面性”,它们的相互信息会导致两分和多部分纠缠之间的精确区别。在仅映射到二维临界渗透的仅测量的稳定电路中,我们表明,相互信息和相互的负性受长距离尺度的边界形成范围的控制。然后,我们考虑通过扰动仅具有渐进级别复杂性水平的单一门的一类“混合”电路模型。尽管其他关键指数在各自的临界点上不同的单一门集合的不同选择却有所不同,但相互的负态在许多混合电路中都具有缩放维度3,这与渗透率截然不同。我们将结果与有限的案例进行了对比,这些案例可提供几何最小切割图片。
We propose entanglement negativity as a fine-grained probe of measurement-induced criticality. We motivate this proposal in stabilizer states, where for two disjoint subregions, comparing their "mutual negativity" and their mutual information leads to a precise distinction between bipartite and multipartite entanglement. In a measurement-only stabilizer circuit that maps exactly to two-dimensional critical percolation, we show that the mutual information and the mutual negativity are governed by boundary conformal fields of different scaling dimensions at long distances. We then consider a class of "hybrid" circuit models obtained by perturbing the measurement-only circuit with unitary gates of progressive levels of complexity. While other critical exponents vary appreciably for different choices of unitary gate ensembles at their respective critical points, the mutual negativity has scaling dimension 3 across remarkably many of the hybrid circuits, which is notably different from that in percolation. We contrast our results with limiting cases where a geometrical minimal-cut picture is available.