论文标题
通过老师中的电子后坐力检测非弹性暗物质
Detection of Inelastic Dark Matter via Electron Recoils in SENSEI
论文作者
论文摘要
低阈值实验Sensei使用了超级噪声硅船长CCD来探索光环中的光暗物质，它在光DM电子散射横截面上达到了最严格的限制。在这项工作中，我们使用Sensei数据研究了无弹性的DM电子散射过程，并以$ U（1）$ GAUGE BOSON作为介体来得出对无弹性暗物质模型的约束。与弹性散射过程相比，我们发现与质量分裂$δ\ equiv m_ {χ_2} -M_ {χ_1} <0 $的下降过程更加严格，而上散射过程$Δ> 0 $ $Δ> 0 $获得较弱的极限。对于质量分配$δ\ sim -5 $ eV的下降过程，DM质量$m_χ$可以将其排除在低至0.1 MEV。
The low-threshold experiment SENSEI, which uses the ultralow-noise silicon Skipper-CCD to explore light dark matter from the halo, has achieved the most rigorous limitations on light DM-electron scattering cross section. In this work, we investigate the inelastic DM-electron scattering process with the SENSEI data and derive the constraints on the inelastic dark matter model with a $U(1)$ gauge boson as the mediator. Comparing with elastic scattering process, we find that the down-scattering process with the mass splitting $δ\equiv m_{χ_2}-m_{χ_1}<0$ is more strongly constrained while the up-scattering process $δ>0$ gets the weaker limits. For the down-scattering process with mass splitting $δ\sim -5$ eV, the DM mass $m_χ$ can be excluded down to as low as 0.1 MeV.
