论文标题
在高尺度缺陷处的电击引起的启动机制
Mechanisms of shock-induced initiation at micro-scale defects in energetic crystal-binder systems
论文作者
论文摘要
嵌入在塑料粘合剂中的能量材料(例如HMX)的晶体是塑料键入炸药的组成部分。这种异质的能量材料包含微结构特征,例如尖锐的角,晶体和粘合剂之间的界面,粒内和粒度外空隙以及其他缺陷。与微结构异质性相互作用时,能量定位或热点是出现的,导致PBX的启动。在本文中,进行高分辨率的数值模拟以阐明PBX中电击引起的启动的机理细节。我们检查了四种不同的机制:在尖锐的角或边缘处进行冲击,及其对晶体形状的依赖以及所施加的冲击的强度;在晶体和粘合剂界面之间进行脱键;位于HMX晶体附近的粘合剂中空隙的崩溃;以及HMX晶体内部空隙的崩溃。这些机制对热点的点火和生长的相对贡献获得了见解。了解这些能量定位机制及其对热点形成和PBX的启动敏感性的相对重要性将有助于设计具有控制敏感性的能量材料驱动的系统,以防止意外引发并确保可靠的性能。
Crystals of energetic materials, such as HMX, embedded in plastic binders are the building blocks of plastic-bonded explosives. Such heterogeneous energetic materials contain microstructural features such as sharp corners, interfaces between crystal and binder, intra- and extra-granular voids, and other defects. Energy localization or hotspots arise during shock interaction with the microstructural heterogeneities, leading to the initiation of PBXs. In this paper, high-resolution numerical simulations are performed to elucidate the mechanistic details of shock-induced initiation in a PBX; we examine four different mechanisms: Shock-focusing at sharp corners or edges and its dependency on the shape of the crystal, and the strength of the applied shock; debonding between crystal and binder interfaces; collapse of voids in the binder located near an HMX crystal; and the collapse of voids within HMX crystals. Insights are obtained into the relative contributions of these mechanisms to the ignition and growth of hotspots. Understanding these mechanisms of energy localization and their relative importance for hotspot formation and initiation sensitivity of PBXs will aid in the design of energetic material-driven systems with controlled sensitivity, to prevent accidental initiation and ensure reliable performance.