论文标题
角度分辨光发射光谱
Angle-resolved photoemission spectroscopy
论文作者
论文摘要
对于固态材料，电子结构E（K）对于确定晶体的物理特性至关重要。通过实验检测电子结构，可以揭示基本物理。角度分辨光发射光谱（ARPES）是一种强大的技术，用于直接观察具有能量和动量分辨信息的电子结构。在过去的几十年中，能源和动量分辨率的重大改善，以及Arpes可观察到的旋转（旋转），微米或纳米侧侧尺寸（微摩尔/纳米摩尔）和fomtsosecond时尺度（Trarpes）的扩展。这些优势已在广泛的量子材料中实现，例如高温超导体，拓扑材料，二维材料和异质结构。该底漆介绍了ARPES原理，仪器，数据分析和代表性科学案例的关键方面，以证明该方法的力量。还讨论了对未来发展的观点和挑战。
For solid-state materials, the electronic structure, E(k), is critical in determining a crystal's physical properties. By experimentally detecting the electronic structure, the fundamental physics can be revealed. Angle-resolved photoemission spectroscopy (ARPES) is a powerful technique for directly observing the electronic structure with energy- and momentum-resolved information. Over the past decades, major improvements in the energy and momentum resolution, alongside the extension of ARPES observables to spin (SpinARPES), micrometer or nanometer lateral dimensions (MicroARPES/NanoARPES), and femtosecond timescales (TrARPES), have led to major scientific advances. These advantages have been achieved across a wide range of quantum materials, such as high-temperature superconductors, topological materials, two-dimensional materials and heterostructures. This primer introduces key aspects of ARPES principles, instrumentation, data analysis, and representative scientific cases to demonstrate the power of the method. Perspectives and challenges on future developments are also discussed.
