论文标题
微钙化计X射线光谱仪的潜力用于测量相对荧光线强度
The potential of microcalorimeter x-ray spectrometers for measurement of relative fluorescence-line intensities
论文作者
论文摘要
我们以前已经使用了具有4 EV能量分辨率的一系列低温微量钙化器来测量灯笼型系列的四个元素的特征L-壳X射线的发射线轮廓和能量：Praseodymium，Neododymium，Neododymium，Neododmium，Terbium和Holmium。我们将相同数据集的功率考虑到线的相对强度的估计。必须校正强度以获得探测器效率和自我吸收，我们估计校正的不确定性。这些数据代表了低温能分散传感器以估计X射线荧光线的相对强度的首次使用之一。他们表明，将未来用微钙化计探测器的薄膜样品进行测量，可以在广泛的能量范围内实现相对线强度低于1％的系统不确定性。
We have previously used an array of cryogenic microcalorimeters with 4 eV energy resolution to measure emission-line profiles and energies of the characteristic L-shell x rays of four elements of the lanthanide series: praseodymium, neodymium, terbium, and holmium. We consider the power of the same data set for the estimation of the lines' relative intensities. Intensities must be corrected for detector efficiency and self-absorption, and we estimate uncertainties on the corrections. These data represent one of the first uses of cryogenic energy-dispersive sensors to estimate the relative intensities of x-ray fluorescence lines. They show that a future measurement of thin-film samples with microcalorimeter detectors could achieve systematic uncertainties below 1% on relative line intensities over a broad energy range.
