论文标题
快速纳米过度自相关器
A rapid nanometre-precision autocorrelator
论文作者
论文摘要
目标深度的精确测量在生物物理和纳米物理学中具有应用，非线性光学方法对非常小的长度尺度上的强度变化敏感。通过利用自相反器对路径长度的依赖性的高灵敏度，我们提出了一种在30秒内实现每个像素的深度分辨率约为$ 30 nm的技术。我们的方法图像使用SCMOS摄像机从非线性晶体上转换脉冲，并将每个像素记录的强度转换为延迟。通过利用统计估计理论并使用来自32 $ \ times $ 32像素的数据，检测到的延迟的标准误差在测量30秒后降至1 nm以下。数值模拟表明，该结果非常接近使用Shot-Noise限制源可以实现的目标，并且与SCMOS摄像机可以实现的精度一致。
The precise measurement of a target depth has applications in biophysics and nanophysics, and non-linear optical methods are sensitive to intensity changes on very small length scales. By exploiting the high sensitivity of an autocorrelator's dependency on path length, we propose a technique that achieves $\approx$30 nm depth resolution for each pixel in 30 seconds. Our method images up-converted pulses from a non-linear crystal using a sCMOS camera and converts the intensity recorded by each pixel to a delay. By utilising statistical estimation theory and using the data from a set of 32$\times$32 pixels, the standard error of the detected delay falls below 1 nm after 30 seconds of measurement. Numerical simulations show that this result is extremely close to what can be achieved with a shot-noise-limited source and is consistent with the precision that can be achieved with a sCMOS camera.
