论文标题
多效Ti $ _3 $ C $ _2 $ T $ _X $ MXENE带有可调铁电控制的高性能电阻器件设备
Multiferroic Ti$_3$C$_2$T$_x$ MXene with Tunable Ferroelectric-controlled High Performance Resistive Memory Devices
论文作者
论文摘要
基于同时的铁电和铁磁现象的多效(MF)设备被认为是未来生物功能的微型/纳米电子学的有希望的候选者。文献中很少报道二维材料中的多种现象。我们报道了一种简单的方法,可以揭示ti $ _3 $ c $ c $ _2 $ t $ t $ _x $ mxene胶片中频率依赖的铁电和毒素性。为了研究铁电性以及多种过度性的频率和脉冲作用,我们在零和非零静态磁场下测量的不同外部频率上进行了电化极化与电场测量。为了进一步调查这种效果,还执行了磁电(ME)耦合,以确认我们合成的Ti $ _3 $ c $ _2 $ _2 $ t $ _x $ _X $ MXENE胶片的多效性质。铁电磁滞效应归因于在低频率下的电域壁的切换,这些较低频率继续在很大程度上响应较高的频率。无序的电偶极子与局部自旋矩之间的耦合可能会导致强烈的磁电耦合。此外,三层记忆设备中的双极电阻转换还支持htti $ _3 $ _3 $ _3 $ c $ _2 $ _2 $ _x $ _x $ mxene膜的铁电行为,并且由于在Ferroelectric ht-ti $ _3 $ c $ _2 $ _2 $ _2 $ _2 $ _x $ _x $ _x $ _x $ _x $ _x $ _x $ _x $ _x $ _x $ _x $ _x的最小介质损失而表现出均匀的可重复性。非feRroelectric ti $ _3 $ c $ _2 $ t $ _x $ mxene。在室温下报告的独特的多性行为以及在此处报道的铁电调整的回忆器设备将有助于了解2D材料的内在性质,并将建立新颖的数据存储设备。
Multiferroic (MF) devices based on simultaneous ferroelectric and ferromagnetic phenomena are considered to be promising candidates for future bi-functional micro/nano-electronics. The multiferroic phenomena in two-dimensional materials is rarely reported in literature. We reported a simple approach to reveal frequency-dependent ferroelectricity and mutiferroicity in Ti$_3$C$_2$T$_x$ MXene film at room-temperature. To study the frequency and poling effect on ferroelectricity as well as multiferroicity, we performed electric polarization vs. electric field measurement at different external frequencies measured under zero and non-zero static magnetic fields. In order to further investigate this effect, the magneto-electric (ME) coupling was also performed to confirm the multiferroic nature of our synthesized Ti$_3$C$_2$T$_x$ MXene film. The ferroelectric hysteresis effect was attributed to the switching of electric domain walls under low frequencies that continue to respond to at much extent to the higher frequencies. The coupling between disordered electric dipoles with local spin moments could cause presence of strong magneto-electric coupling. Moreover, the bipolar resistive switching in trilayer memory devices also supports the ferroelectric behavior of HT- Ti$_3$C$_2$T$_x$ MXene film and showed uniform repeatability in switching behavior due to minimum dielectric loss inside ferroelectric HT-Ti$_3$C$_2$T$_x$ MXene along with improved on/off ratio in comparison to non-ferroelectric Ti$_3$C$_2$T$_x$ MXene. The unique multiferroic behavior along with ferroelectric-tuned memristor devices reported here at room temperature will help understand the intrinsic nature of 2D materials and will establish novel data storage devices.