论文标题
甚至更轻的粒子暗物质
Even Lighter Particle Dark Matter
论文作者
论文摘要
我们报告了搜索质量从1 MeV到1 GEV的质量的最新进展。预计在直接检测实验中，预计该质量范围的几个候选物将产生可测量的电子回收信号。我们专注于半导体检测器中电子散射的暗物质颗粒，因为它们由于其低电离阈值而具有最高的灵敏度。电荷耦合装置（CCD）硅探测器是领先的技术，未来几年预计会取得重大进展。我们介绍了CCD计划的状态，并简要报告其他努力。
We report on recent progress in the search for dark matter particles with masses from 1 MeV to 1 GeV. Several dark matter candidates in this mass range are expected to generate measurable electronic-recoil signals in direct-detection experiments. We focus on dark matter particles scattering with electrons in semiconductor detectors since they have fundamentally the highest sensitivity due to their low ionization threshold. Charge-coupled device (CCD) silicon detectors are the leading technology, with significant progress expected in the coming years. We present the status of the CCD program and briefly report on other efforts.
