论文标题
使用集成混合像素检测器的电荷检测MEV电子
Detection of MeV electrons using a charge integrating hybrid pixel detector
论文作者
论文摘要
电子作为基于衍射研究的X射线的强烈补充而出现。在本文中，我们研究了Jungfrau检测器在脉冲电子源处具有320 UM厚硅传感器的性能。 Jungfrau最初开发用于自由电子激光器的X射线检测，其动态范围为120 MeV/Pixel（用像素内增益开关实现），在MEV区域中，每个像素和框架都转化为大约1200个入射电子。我们预设基本特征，例如每个入射粒子沉积的能量，导致簇大小和空间分辨率以及动态（强度）范围扫描。在4、10和20 MEV/c进行测量。我们将测量结果与基于GEANT4的模拟进行比较，并使用这些模拟将结果推断为不同的传感器厚度。
Electrons are emerging as a strong complement to X-rays for diffraction based studies. In this paper we investigate the performance of a JUNGFRAU detector with 320 um thick silicon sensor at a pulsed electron source. Originally developed for X-ray detection at free electron lasers, JUNGFRAU features a dynamic range of 120 MeV/pixel (implemented with in-pixel gain switching) which translated to about 1200 incident electrons per pixel and frame in the MeV region. We preset basic characteristics such as energy deposited per incident particle, resulting cluster size and spatial resolution along with dynamic (intensity) range scans. Measurements were performed at 4, 10 and 20 MeV/c. We compare the measurements with GEANT4 based simulations and extrapolate the results to different sensor thicknesses using these simulations.
