论文标题
在角度分辨光发射实验中，精度优于1 \ um〜的样品位置 - 自动校正系统
A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments
论文作者
论文摘要
我们介绍了用于光发射实验的高精度样本 - 位置自动校正系统。实现了基于图像模式匹配计算的双眼视觉方法，以比1 \ um更好的精度跟踪样品位置，该样品的精度远小于入射激光器的斑点大小。我们说明了拓扑绝缘子BI $ _2 $ SE $ _3 $和最佳掺杂的铜层超导体\ bi的代表性光发射数据的样品位置 - 自动校正系统的性能。我们的方法为通过基于激光或空间分辨的光发射系统具有高精度和效率来研究量子材料中温度依赖的电子结构提供了新的可能性。
We present the development of a high-precision sample-position-autocorrection system for photoemission experiments. A binocular vision method based on image pattern matching calculations was realized to track the sample position with an accuracy better than 1 \um, which was much smaller than the spot size of the incident laser. We illustrate the performance of the sample-position-autocorrection system with representative photoemission data on the topological insulator Bi$_2$Se$_3$ and an optimally-doped cuprate superconductor \Bi. Our method provides new possibilities for studying the temperature-dependent electronic structures in quantum materials by laser-based or spatially resolved photoemission systems with high precision and efficiency.
