论文标题

几乎匹配GAAS/PB(1-X)SN(X)TE Core-Shell纳米线的晶格

Nearly Lattice Matched GaAs/Pb(1-x)Sn(x)Te Core-Shell Nanowires

论文作者

Dad, Sania, Dziawa, Piotr, Zajkowska, Wiktoria, Kret, Sławomir, Kozłowski, Mirosław, Wójcik, Maciej, Sadowski, Janusz

论文摘要

我们研究了由分子束外延沉积在Wurtzite Gaas纳米线(NWS)侧壁上的PB(1-X)SN(X)SN(X)TE拓扑结晶绝缘子(NWS)的全部和半壳。由于IV-VI壳相对于III-V核的明显取向,因此沿纳米线轴的晶格不匹配小于4%。由于某些临界浓度的SN(X> = 0.4),选择了Pb(1-X)SN(X)TE实心溶液。 IV-VI壳具有从二进制SNTE,通过Pb(1-X)SN(X)TE的不同组合物生长,X值降低至二进制PBTE(X = 0)。样品通过扫描透射电子显微镜进行分析,该透射电子显微镜揭示了(110)或(100)方向的二进制PBTE,以及(100)Pb(1-X)SN(X)SN(X)SN(X)TE在Wurtzite GAAS NWS的侧壁上。

We investigate the full and half-shells of Pb(1-x)Sn(x)Te topological crystalline insulator deposited by molecular beam epitaxy on the sidewalls of wurtzite GaAs nanowires (NWs). Due to the distinct orientation of the IV-VI shell with respect to the III-V core the lattice mismatch along the nanowire axis is less than 4%. The Pb(1-x)Sn(x)Te solid solution is chosen due to the topological crystalline insulator properties for some critical concentrations of Sn (x >= 0.4). The IV-VI shells are grown with different compositions spanning from binary SnTe, through Pb(1-x)Sn(x)Te with decreasing x value down to binary PbTe (x = 0). The samples are analyzed by scanning transmission electron microscopy, which reveals the presence of (110) or (100) oriented binary PbTe and (100)Pb(1-x)Sn(x)Te on the sidewalls of wurtzite GaAs NWs.

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