论文标题
界面X射线界面电荷转移和结构重排的表征
Operando X-ray characterization of interfacial charge transfer and structural rearrangements
论文作者
论文摘要
能量转换和存储，传感和化学合成方面的关键技术依赖于有关电动固液界面上电荷转移过程的详细知识。但是，这些接口不断地演变为应用电位，离子浓度和时间的函数。因此，在工作条件下，我们需要表征液体和界面的固体侧的化学组成，原子布置和电子结构。在本章中，我们讨论了基于X射线的最新光谱和衍射方法，以进行这种“操作”特征。我们重点介绍了文献的最新示例，并证明了X射线吸收光谱，X射线光电子光谱和表面X射线衍射如何揭示所需的界面敏感信息。
Key technologies in energy conversion and storage, sensing and chemical synthesis rely on a detailed knowledge about charge transfer processes at electrified solid-liquid interfaces. However, these interfaces continuously evolve as a function of applied potentials, ionic concentrations and time. We therefore need to characterize chemical composition, atomic arrangement and electronic structure of both the liquid and the solid side of the interface under operating conditions. In this chapter, we discuss the state-of-the-art X-ray based spectroscopy and diffraction approaches for such 'operando' characterization. We highlight recent examples from literature and demonstrate how X-ray absorption spectroscopy, X-ray photoelectron spectroscopy and surface X-ray diffraction can reveal the required interface-sensitive information.
