论文标题
转基因辐射发射光谱法获得的triumβ光谱和中微子质量极限
Tritium Beta Spectrum and Neutrino Mass Limit from Cyclotron Radiation Emission Spectroscopy
论文作者
论文摘要
中微子质量的绝对尺度在从粒子到宇宙学的每个尺度的物理学中都起着至关重要的作用。 Tritium端点光谱的测量结果为中微子质量尺度提供了最精确的直接限制。在这封信中，我们通过项目8提出了对基于第一个基于频率的中微子质量限制的回旋子辐射发射光谱（CRES）技术的进步。只有CM $^3 $ -SCALE的物理检测量，从贝叶斯（频繁）分析中的连续tritium beta频谱的无背景测量中提取了$m_β{<} $ 155 eV（$ 152 $ eV）的限制。使用$^{83 {\ rm m}} $ kr校准数据，测量了改进的分辨率为1.66 $ {\ pm} $ 0.19 eV（fwhm），验证了检测器响应模型，并且效率是通过多KEV Tritium Analysis窗口进行了表征的。这些测量值确定了CRE的潜力，对于具有低背景和高分辨率的高灵敏性下一代中微子质量实验。
The absolute scale of the neutrino mass plays a critical role in physics at every scale, from the particle to the cosmological. Measurements of the tritium endpoint spectrum have provided the most precise direct limit on the neutrino mass scale. In this Letter, we present advances by Project 8 to the Cyclotron Radiation Emission Spectroscopy (CRES) technique culminating in the first frequency-based neutrino mass limit. With only a cm$^3$-scale physical detection volume, a limit of $m_β{<}$155 eV ($152$ eV) is extracted from the background-free measurement of the continuous tritium beta spectrum in a Bayesian (frequentist) analysis. Using $^{83{\rm m}}$Kr calibration data, an improved resolution of 1.66${\pm}$0.19 eV (FWHM) is measured, the detector response model is validated, and the efficiency is characterized over the multi-keV tritium analysis window. These measurements establish the potential of CRES for a high-sensitivity next-generation direct neutrino mass experiment featuring low background and high resolution.
