ICS35.240.01 CCSL70 BDT 中国半导体行业协会团体标准 T/BDT004—2024 RISC-V单线调试接口技术要求 Technical specification for RISC-V 1-line debug interface （发布稿） 2024-10- 09发布 中国半导体行业协会  发2024- 10-10实施 布 全国团体标准信息平台 全国团体标准信息平台 T/BDT004—2024 I目次 前言.................................................................................III 1范围................................................................................1 2规范性引用文件......................................................................1 3术语和定义..........................................................................1 4缩略语..............................................................................2 5基本结构............................................................................2 5.1调试模块（DM）..................................................................2 5.2调试模块接口（DMI）.............................................................2 5.3调试传输模块（DTM）.............................................................3 5.4调试系统简易框图................................................................3 6调试传输协议规范....................................................................3 6.1概述............................................................................3 6.2数据包格式......................................................................3 6.2.1NewPacket..................................................................3 6.2.2BypPacket..................................................................3 6.2.3数据包访问格式..............................................................4 6.3位定义..........................................................................4 6.3.1位定义的判断依据............................................................4 6.3.2速度模式....................................................................4 6.4调试接口寄存器..................................................................5 6.4.1调试接口寄存器类型..........................................................5 6.4.2能力寄存器（CPBR）..........................................................5 6.4.3配置寄存器（CFGR）..........................................................6 6.4.4影子配置寄存器（SHDWCFGR）..................................................6 6.5配置实例........................................................................7 7调试模块............................................................................7 7.1调试操作........................................................................7 7.2调试模块寄存器类型..............................................................7 7.2.1概述........................................................................7 7.2.2数据寄存器0（data0）.......................................................8 7.2.3数据寄存器1（data1）.......................................................8 7.2.4调试模块控制寄存器（dmcontrol）.............................................8 7.2.5调试模块状态寄存器（dmstatus）..............................................9 7.2.6微处理器状态寄存器（hartinfo）..............................................9 7.2.7抽象命令控制与状态寄存器（abstractcs）......................................9 7.2.8抽象命令寄存器（command）..................................................10 7.2.9抽象命令自动执行寄存器（abstractauto）.....................................10 7.2.10指令缓存寄存器（progbufx）................................................11 全国团体标准信息平台 T/BDT004—2024 II7.2.11暂停状态寄存器（haltsum0）................................................11 7.2.12调试控制和状态寄存器（dcsr）..............................................11 7.2.13调试模式程序指针（dpc）...................................................12 7.3操作实例.......................................................................12 附录A（资料性）配置实例.............................................................13 A.1配置实例描述...................................................................13 A.1.1使能从机输出...............................................................13 A.1.2配置时基分频系数为1分频...................................................13 A.1.3复位调试接口...............................................................13 附录B（资料性）操作实例.............................................................14 B.1暂停微处理器................................